Published July 10, 1999 | Version v1
Report

Beam Profile Measurement at 30 GeV Using Optical Transition Radiation

Description

We present results of measurements of spot size and angular divergence of a 30 GeV electron beam through use of optical transition radiation (OTR). The OTR near field pattern and far field distribution are measured as a function of beam spot size and divergence at wavelengths of 441, 532, and 800 nm, for both the single and double foil configurations. Electron beam spot sizes of 50 microm rms have been resolved, demonstrating the utility of OTR for measurement of small beam spot sizes of high energy (30 GeV) electron beams. Two-foil interference was clearly observed and utilized electron beam angular divergences of approximately 100 microrad

Availability note (English)

Available from PURL: https://www.osti.gov/servlets/purl/10510-u6fOKk/native/

Additional details

Publishing Information

Imprint Pagination
[vp.]
Report number
SLAC-PUB--8190

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
32040044
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
BEAM MONITORING; BEAM PROFILES; ELECTRON BEAMS; GEV RANGE 10-100; TRANSITION RADIATION; WAVELENGTHS
Descriptors DEC
BEAMS; ELECTROMAGNETIC RADIATION; ENERGY RANGE; GEV RANGE; LEPTON BEAMS; MONITORING; PARTICLE BEAMS; RADIATIONS

Optional Information

Contract/Grant/Project number
AC03-76SF00515
Funding organization
USDOE Office of Energy Research (ER) (United States)