Published 1972 | Version v1
Book

Electrical measurements of mass resolved ion beams

  • 1. Ames Lab., IA

Description

no abstract available

Additional details

Additional titles

Augmented title (English)
Review

Publishing Information

Publisher
Academic Press, Inc.
Imprint Place
New York
Imprint Title
Trace analysis by mass spectrometry
Imprint Pagination
p. 135-177.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
5128236
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Descriptors DEI
BEAM CURRENTS; ION BEAMS; REVIEWS
Descriptors DEC
BEAMS; CURRENTS; DOCUMENT TYPES