X-ray fluorescence determination of composition of the high temperature superconductors by the fundamental parameter method

Y, Pr, Ba and Cu compositions of the series of the Y1-xPrxBa2Cu3Oy samples have been determined by using X-ray fluorescence (XRF) fundamental parameter method in a non-destruction state. The composition is given by an atomic fraction. The determined compositions of the samples show a difference from their nominal compositions. One of the reasons why the exact shape of Tc vs x varies is different from group to group, as reported, is the difference of the real and the nominal compositions. The relation of Tc vs x is not a simple quadric curve. The results agree well with those obtained by the inductively coupled plasma atomic emission spectrometer (ICP-AES), which indicates that the method is appropriate for the determination of the compositions of the high temperature superconductors. In addition, the influence of oxygen on analytical elements is discussed. The fraction of the matrix total mass absorption, which is associated with oxygen for each analytical line, is less than 3.41%