Published July 1, 2016
| Version v1
Journal article
Facile synthesis of higher manganese silicide employing spark plasma assisted reaction sintering with enhanced thermoelectric performance
- 1. Department of Mechanical Engineering, Delhi Technological University, Delhi 110042 (India)
- 2. CSIR-Network of Institutes for Solar Energy, CSIR-National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi 110012 (India)
Description
This work reports a facile synthesis of aluminium doped higher manganese silicides using a single-step spark plasma assisted in-situ reaction sintering process, which takes only a few minutes as opposed to few hours employing conventional processing methods. Despite employing this cost-effective material processing technique, a figure of merit ~ 0.65 at 873 K was realized, which is comparable to the best value reported thus far. The phase purity, elemental distribution, morphology and structure was investigated employing X-ray diffraction, scanning, transmission electron microscopy and energy dispersive spectroscopy, based on which the thermoelectric performance has been discussed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2016.03.026Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2016.03.026;
- PII
- S1359-6462(16)30112-9;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 119
- Journal Page Range
- p. 60-64
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48012779
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM; COMPARATIVE EVALUATIONS; DOPED MATERIALS; MANGANESE; MANGANESE SILICIDES; MICROSTRUCTURE; MORPHOLOGY; PLASMA; SINTERING; SYNTHESIS; THERMOELECTRIC MATERIALS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; EVALUATION; FABRICATION; MANGANESE COMPOUNDS; MATERIALS; METALS; MICROSCOPY; SCATTERING; SILICIDES; SILICON COMPOUNDS; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.