Sintering behavior in zirconium phosphate bonded silicon nitride porous ceramics
- 1. State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070 (China)
- 2. Department of Chemical Engineering and Materials Science, University of California Davis, CA 95616 (United States)
Description
A new method for preparing high bending strength porous silicon nitride ceramics with controlled porosity has been developed by using a pressureless sintering technique with zirconium phosphate (ZrP2O7) as a binder phase. The sintering behavior in these porous ceramics is investigated in this study by using XRD, SEM, and HRTEM analysis. The results show that the sintering process can be divided into two stages: one is at temperatures below 250 deg. C, during which ZrO2 can react completely with H3PO4 to form ZrP2O7, and a ZrP2O7 bonded Si3N4 porous structure is formed; the other is at temperatures above 250 deg. C, at which solid state sintering of the ZrP2O7 dominates and a continuous open porosity network is obtained. The effect of the ZrP2O7 binder content on sintering behavior, porosity and mechanical properties is also investigated
Availability note (English)
Available from http://dx.doi.org/10.1016/j.msea.2008.07.071Additional details
Identifiers
- DOI
- 10.1016/j.msea.2008.07.071;
- PII
- S0921-5093(08)00926-X;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 497
- Journal Issue
- 1-2
- Journal Page Range
- p. 495-500
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40068673
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CERAMICS; FLEXURAL STRENGTH; PHOSPHORIC ACID; POROSITY; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; SILICON NITRIDES; SINTERING; TEMPERATURE RANGE 0400-1000 K; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; ZIRCONIUM OXIDES; ZIRCONIUM PHOSPHATES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; FABRICATION; HYDROGEN COMPOUNDS; INORGANIC ACIDS; INORGANIC COMPOUNDS; MATERIALS; MECHANICAL PROPERTIES; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHOSPHATES; PHOSPHORUS COMPOUNDS; PNICTIDES; SCATTERING; SILICON COMPOUNDS; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; ZIRCONIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.