Surface morphology and electrical transport properties of Aberchrome 670 ( (E-3(admantan-2-ylidene) -4-[1-(2,5-dimethyl-3-furyl) ethyldene] dihydro-2,5-furandione)) nano thickness films
Creators
- 1. Thin Films and solar cells Laboratory, Physics Department, Faculty of Education, Ain Shams University, Roxy, Cairo, 11341 (Egypt)
Description
In this paper, surface morphology and electrical properties of Aberchrome 670 , [(E-3(admantan-2-ylidene)-4-[1-(2,5-dimethyl-3-furyl) ethyldene] dihydro -2,5-furandione)], thin films with nano thickness, have been studied, for the first time, to provide one with knowledge concerning microscopic features, for electrical applications of organic photochromic compounds. The atomic force microscope (AFM) has been used to convene a general spectacle about the surface. The cyclic-voltammetric measurement has been inserted to determine the electrochemical gap. The thermal effect on the electrical resistivity, the thermoelectric power and Seebeck coefficient have been measured from 298 to 373 K. The influence of the frequency on some dielectric characteristics; such as the capacitance, the temperature capacitance coefficient (T.C.C), the real part of the complex dielectric permittivity (), the dissipation factor (tan (δ)) has been studied in the frequency zone (50 -5 MHz) and temperature range (∼298–373 K) at different steady temperatures. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2053-1591/ab640bAdditional details
Identifiers
Publishing Information
- Journal Title
- Materials Research Express (Online)
- Journal Volume
- 6
- Journal Issue
- 12
- Journal Page Range
- [12 p.]
- ISSN
- 2053-1591
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52014527
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CAPACITANCE; DIELECTRIC MATERIALS; DISSIPATION FACTOR; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; MORPHOLOGY; PERMITTIVITY; TANTALUM NITRIDES; TEMPERATURE DEPENDENCE; THICKNESS; THIN FILMS
- Descriptors DEC
- CHEMISTRY; DIELECTRIC PROPERTIES; DIMENSIONLESS NUMBERS; DIMENSIONS; ELECTRICAL PROPERTIES; FILMS; MATERIALS; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; PHYSICAL PROPERTIES; PNICTIDES; REFRACTORY METAL COMPOUNDS; TANTALUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS