Published September 3, 1987 | Version v1
Patent

Method of aligning a linear array x-ray detector

Description

An X-ray inspection system includes an X-ray source for generating a directed X-ray beam and a linear array detector for measuring the intensity of the received radiation and generating electrical signals representative thereof. A method for aligning the detector with the directed X-ray beam includes removing any part between the X-ray source and the detector, opening an X-ray beam limiter, positioning the linear array detector for maximum signal from each detector element, reducing the X-ray beam limiter opening, detecting whether any signal from a detector element is reduced, moving the limiter for producing a maximum signal from each element, securing the X-ray beam limiter, and positioning the detector array for maximum signal. The method is applied to apparatus for inspecting turbine blades. (author)

Availability note (English)

Available from The Patent Office, 25 Southampton Buildings, London, WC2A 1AY.

Additional details

Publishing Information

Imprint Pagination
9 p.
IPC:
Int. Cl. G01t1/29.
IPC
Int. Cl. G01t1/29.
Patent number
GB patent document 2187370/A/

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
19032913
Subject category
S42: ENGINEERING;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
AIRCRAFT; ALIGNMENT; DIGITAL SYSTEMS; GAS TURBINES; INDUSTRIAL RADIOGRAPHY; INSPECTION; SPECIFICATIONS; TURBINE BLADES; X-RAY DETECTION; X-RAY RADIOGRAPHY; X-RAY SOURCES
Descriptors DEC
DETECTION; MATERIALS TESTING; NONDESTRUCTIVE TESTING; RADIATION DETECTION; RADIATION SOURCES; TESTING; TURBINES

Optional Information

Secondary number(s)
US priority 832973.