Published July 2017 | Version v1
Journal article

Design of preamplifier for output current measurement system of semiconductor detector

  • 1. Department of Instrument Science and Technology, National University of Defense Technology, Changsha (China)

Description

In order to meet the needs of the semiconductor detector output current measurement system, designed with the corresponding preamplifier. The preamplifier is based on the ultra-low bias current op amp ADA4530, using a single feedback resistor and a T-feedback network of I/V conversion preamplifier circuits. The results show that the preamplifier has a gain of 10 mV/pA and a DC offset of 8 μV. For the pA resolution, the output noise voltage density is only 17.75 nV/(Hz)1/2, and the total noise is 409 μV. It can be used for the range of pA∼pA current signal measurement of nuclear radiation detector. (authors)

Additional details

Publishing Information

Journal Title
Nuclear Electronics and Detection Technology
Journal Volume
37
Journal Issue
7
Journal Page Range
p. 667-672
ISSN
0258-0934

Optional Information

Notes
10 figs., 3 tabs., 6 refs.