Published March 1996
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The first data of double differential cross-section of 12C(p,p') at 300MeV with a stacked NaI(Tl) spectrometer
Creators
- 1. Kyushu Univ., Fukuoka (Japan). Faculty of Engineering
Description
A stacked NaI(Tl) spectrometer is developed to study the pre-equilibrium process in intermediate energy. Detector tests were performed using 300 and 350MeV proton beams from the ring cyclotron at the Research Center for Nuclear Physics(RCNP), Osaka university. The ΔE-E technique is applied to identify particles and nuclear reactions in the detector materials. The tail in peak spectrum is suppressed clearly and the peak efficiency is reasonably estimated with a monochromatic energy particle. The first and preliminary data of double differential cross section of 12C(p,p') at 300MeV are obtained. (author)
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28010507.pdf
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Additional details
Publishing Information
- Imprint Title
- Proceedings of the 1995 symposium on nuclear data
- Imprint Pagination
- 364 p.
- Journal Page Range
- p. 110-114.
- Report number
- JAERI-Conf--96-008
Conference
- Title
- 1995 symposium on nuclear data.
- Dates
- 16-17 Nov 1995.
- Place
- Tokai, Ibaraki (Japan).
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 28010507
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CARBON 12 TARGET; DIFFERENTIAL CROSS SECTIONS; EXPERIMENTAL DATA; INELASTIC SCATTERING; MEV RANGE 100-1000; NAI DETECTORS; NUCLEAR REACTION KINETICS; PRECOMPOUND-NUCLEUS EMISSION; PROTON REACTIONS; PROTON SPECTRA; RCNP CYCLOTRON; SILICON DIODES; TELESCOPE COUNTERS
- Descriptors DEC
- ACCELERATORS; BARYON REACTIONS; CROSS SECTIONS; CYCLIC ACCELERATORS; CYCLOTRONS; DATA; ENERGY RANGE; HADRON REACTIONS; HEAVY ION ACCELERATORS; INFORMATION; ISOCHRONOUS CYCLOTRONS; KINETICS; MEASURING INSTRUMENTS; MEV RANGE; NUCLEAR REACTIONS; NUCLEON REACTIONS; NUMERICAL DATA; RADIATION DETECTORS; REACTION KINETICS; SCATTERING; SCINTILLATION COUNTERS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SOLID SCINTILLATION DETECTORS; SPECTRA; TARGETS
Optional Information
- Secondary number(s)
- INDC(JPN)--175/U.