Fabrication of n-Zn1−xGaxO/p-(ZnO)1−x(GaP)x thin films and homojunction
- 1. Thin Film Laboratory, Department of Physics, National Institute of Technology, Tiruchirappalli 620015 (India)
Description
Highlights: ► An idea of direct doping donor and acceptor (GaP) into ZnO to realize p-ZnO. ► n-ZnO films have been grown by monodoping Ga into ZnO. ► ZnO homojunction has been fabricated using best monodoped and codoped ZnO films. ► Fabricated homojunction shows typical rectification behavior of the diode. - Abstract: Ga doped ZnO (GZO) and GaP codoped ZnO (GPZO) thin films of different concentrations (1–4 mol%) have been grown on sapphire substrates by RF sputtering for the fabrication of ZnO homojunction. The grown films have been characterized by X-ray diffraction (XRD), photoluminescence (PL), Hall measurement, energy dispersive spectroscopy (EDS), time-of-flight secondary ion mass spectrometer (ToF-SIMS), UV–Vis–NIR spectroscopy and atomic force microscopy (AFM). Unlike in conventional codoping, here we directly doped (codoped) GaP into ZnO to realize p-ZnO. The Hall measurements indicate that 2 and 4% GPZO films exhibit p-conductivity due to the sufficient amount of phosphorous incorporation while all the monodoped GZO films showed n-conductivity as expected. Among the p-ZnO films, 2% GPZO film shows low resistivity (2.17 Ωcm) and high hole concentration (1.8 × 1018 cm−3) by optimum incorporation of phosphorous due to best codoping. Similarly, among the n-type films, 2% GZO shows low resistivity (1.32 Ωcm) and high electron concentration (2.02 × 1019 cm−3) by optimum amount of Ga incorporation. The blue shift and red shift in NBE emission observed from PL acknowledged the formation of n- and p-conduction in monodoped and codoped films, respectively. The neutral acceptor bound exciton recombination (A0X) observed by low temperature PL for 2% GPZO confirms the p-conductivity. Further, the high concentration of P atoms than Ga observed from ToF-SIMS (2% GPZO) also supports the p-conductivity of the films. The fabricated p–n junction with best codoped p-(ZnO)0.98(GaP)0.02 and best monodoped n-Zn0.98Ga0.02O films showed typical rectification behavior of a diode. The diode parameters have also been estimated for the fabricated homojunction.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.mseb.2012.10.005Additional details
Identifiers
- DOI
- 10.1016/j.mseb.2012.10.005;
- PII
- S0921-5107(12)00486-2;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 178
- Journal Issue
- 1
- Journal Page Range
- p. 31-38
- ISSN
- 0921-5107
- CODEN
- MSBTEK
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44110115
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CONCENTRATION RATIO; DOPED MATERIALS; GALLIUM PHOSPHIDES; ION MICROPROBE ANALYSIS; MASS SPECTROMETERS; MASS SPECTROSCOPY; PHOTOLUMINESCENCE; RED SHIFT; SAPPHIRE; SPUTTERING; THIN FILMS; TIME-OF-FLIGHT METHOD; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; COHERENT SCATTERING; CORUNDUM; DIFFRACTION; DIMENSIONLESS NUMBERS; EMISSION; FILMS; GALLIUM COMPOUNDS; LUMINESCENCE; MATERIALS; MEASURING INSTRUMENTS; MICROANALYSIS; MICROSCOPY; MINERALS; NONDESTRUCTIVE ANALYSIS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PHOTON EMISSION; PNICTIDES; SCATTERING; SPECTROMETERS; SPECTROSCOPY; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.