Published September 1992 | Version v1
Journal article Metadata-only

Precision measurements of wavelengths of x-ray spectral lines of multiply charged ions in a recombining laser plasma

Creators

  • 1. All-Union Scientific-Research Institute of Physicotechnical and Radio Engineering Measurements, Moscow (Russian Federation)

Description

A method of improving the accuracy of measurements of the wavelengths of spectral lines of multiply charged ions was proposed and implemented experimentally. The method involved recording the emission spectra of a recording laser plasma. Wavelengths of various lines of FVIII and FIX ions were measured with a relative error δλ/λ∼(6-8)x10-5. 5 refs., 3 figs., 1 tab

Additional details

Publishing Information

Journal Title
Soviet Journal of Quantum Electronics
Journal Volume
22
Journal Issue
9
Journal Page Range
p. 853-855.
ISSN
0049-1748
CODEN
SJQEAF

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
24060375
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Numerical Data, Translation
Descriptors DEI
ACCURACY; EMISSION SPECTRA; EXPERIMENTAL DATA; F STATES; IONS; LASER-PRODUCED PLASMA; MEASURING INSTRUMENTS; WAVELENGTHS; X-RAY SPECTRA
Descriptors DEC
CHARGED PARTICLES; DATA; ENERGY LEVELS; INFORMATION; NUMERICAL DATA; PLASMA; SPECTRA

Optional Information

Notes
Cover-to-cover Translation of Kvantovaja Elektronika (USSR); Translated from Kvantovaya Elektronika; 19: No. 9, 916-918(Sep 1992).