Published May 15, 2006 | Version v1
Journal article

Magnetic field profiles of a superconducting strip in an oblique magnetic field

  • 1. B. Verkin Institute for Low Temperature Physics and Engineering, Ukrainian Academy of Sciences, Kharkov 61103 (Ukraine)
  • 2. Max-Planck-Institut fuer Metallforschung, D-70506 Stuttgart (Germany)

Description

We consider the critical state of a thin superconducting strip in an oblique applied magnetic field H a without any restrictions on the dependence of the critical current density j c on the local magnetic induction B. In such a strip, j c in general is not constant across the thickness of the sample and differs from J c/d, where J c is the critical sheet current. It is shown that in the case of B-dependent j c, the profiles H z(x) of the magnetic-field component perpendicular to the strip plane generally depend on the in-plane component H ax of the applied magnetic field H a. On the basis of this analysis, we explain how one can extract j c(B) from the magnetic-field profiles H z(x) measured by magneto-optical imaging at the upper surface of the strip

Additional details

Identifiers

DOI
10.1016/j.physc.2005.12.031;
PII
S0921-4534(05)00855-5;

Publishing Information

Journal Title
Physica. C, Superconductivity
Journal Volume
437-438
Journal Page Range
p. 204-207
ISSN
0921-4534
CODEN
PHYCE6

Conference

Title
4. international conference on vortex matter in nanostructured superconductors
Acronym
VORTEX IV
Dates
3-9 Sep 2005
Place
Crete (Greece)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38064408
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRITICAL CURRENT; CURRENT DENSITY; INDUCTION; MAGNETIC FIELDS; MAGNETIC FLUX; MAGNETO-OPTICAL EFFECTS; SUPERCONDUCTIVITY; THICKNESS; VORTICES
Descriptors DEC
CURRENTS; DIMENSIONS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; PHYSICAL PROPERTIES

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.