Magnetic field profiles of a superconducting strip in an oblique magnetic field
- 1. B. Verkin Institute for Low Temperature Physics and Engineering, Ukrainian Academy of Sciences, Kharkov 61103 (Ukraine)
- 2. Max-Planck-Institut fuer Metallforschung, D-70506 Stuttgart (Germany)
Description
We consider the critical state of a thin superconducting strip in an oblique applied magnetic field H a without any restrictions on the dependence of the critical current density j c on the local magnetic induction B. In such a strip, j c in general is not constant across the thickness of the sample and differs from J c/d, where J c is the critical sheet current. It is shown that in the case of B-dependent j c, the profiles H z(x) of the magnetic-field component perpendicular to the strip plane generally depend on the in-plane component H ax of the applied magnetic field H a. On the basis of this analysis, we explain how one can extract j c(B) from the magnetic-field profiles H z(x) measured by magneto-optical imaging at the upper surface of the strip
Additional details
Identifiers
- DOI
- 10.1016/j.physc.2005.12.031;
- PII
- S0921-4534(05)00855-5;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 437-438
- Journal Page Range
- p. 204-207
- ISSN
- 0921-4534
- CODEN
- PHYCE6
Conference
- Title
- 4. international conference on vortex matter in nanostructured superconductors
- Acronym
- VORTEX IV
- Dates
- 3-9 Sep 2005
- Place
- Crete (Greece)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38064408
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRITICAL CURRENT; CURRENT DENSITY; INDUCTION; MAGNETIC FIELDS; MAGNETIC FLUX; MAGNETO-OPTICAL EFFECTS; SUPERCONDUCTIVITY; THICKNESS; VORTICES
- Descriptors DEC
- CURRENTS; DIMENSIONS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; PHYSICAL PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.