Steady-state and transient microscale temperature measurements by multispectral method and photons counting
- 1. LIMATB, Université de Bretagne-Sud, Rue de Saint Maudé, Boîte Postale 92 116, 56 321 Lorient Cedex (France)
- 2. Institut Universitaire des Systèmes Thermiques Industriels, Aix Marseille Université, CNRS, IUSTI UMR 7343, 5 rue Enrico Fermi, 13 453 Marseille (France)
- 3. LEMTA, Nancy-Université, CNRS, 2, Avenue de la Forêt de Haye – Boîte Postale 160, 54 504 Vandoeuvre-lès-Nancy Cedex (France)
- 4. Université Internationale de Rabat ECINE, Sala El Jadida, 11100, Maroc (Morocco)
Description
Highlights: • A three wavelengths pyrometer able to focus on a micrometric surface collects the photons emitted by this surface. • The wavelengths are selected according to several criteria and a global function takes into account the spectral parameters. • The photonic emission is a random phenomenon and the Gaussian law estimates an average photonic flux for each wavelength. • The temperature is estimated by a least-squares method from a multispectral pyrometer. - Abstract: This work presents steady-state and transient microscale temperature measurements by optical and multispectral method in the ultraviolet-visible wavelengths. Regarding the classic laws of radiative heat transfers, the photon counting is preferred to the energy measurement. The photonic emission is a random phenomenon and is here measured with statistical laws such as the Gaussian law. The spectral dependence of the optical apparatus transfer function is taken into account by a linear function and the temperature is estimated by inversion with a Levenberg–Marquardt algorithm. Measurements are performed with a small-dimension blackbody developed in the laboratory and with a Chromel wire. Both of them are capable of heating up above 1000 °C. The diameters of the observed surfaces are 10 µm and 5 µm, respectively. The theoretical criterion of wavelength selection and least-squares parameter estimation allow for a difference between the estimated and controlled temperatures lower than 4%.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.applthermaleng.2015.12.134Additional details
Identifiers
- DOI
- 10.1016/j.applthermaleng.2015.12.134;
- PII
- S1359-4311(16)00025-9;
Publishing Information
- Journal Title
- Applied Thermal Engineering
- Journal Volume
- 99
- Journal Issue
- Complete
- Journal Page Range
- p. 343-351
- ISSN
- 1359-4311
- CODEN
- ATENFT
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48015932
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ALGORITHMS; CHROMEL; EMISSION; GAUSS FUNCTION; HEAT; HEAT TRANSFER; HEATING; LEAST SQUARE FIT; PHOTONS; PYROMETERS; STEADY-STATE CONDITIONS; SURFACES; TEMPERATURE MEASUREMENT; TEMPERATURE RANGE 1000-4000 K; TRANSFER FUNCTIONS; TRANSIENTS; ULTRAVIOLET RADIATION; WAVELENGTHS
- Descriptors DEC
- ALLOYS; BOSONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ENERGY; ENERGY TRANSFER; FUNCTIONS; MASSLESS PARTICLES; MATHEMATICAL LOGIC; MATHEMATICAL SOLUTIONS; MAXIMUM-LIKELIHOOD FIT; MEASURING INSTRUMENTS; NICKEL ALLOYS; NICKEL BASE ALLOYS; NUMERICAL SOLUTION; RADIATIONS; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.