Published April 1976
| Version v1
Journal article
VUV-spectroscopy of multiply charged ion source-plasmas
Description
The ion charge state distribution (CSD) in a multiply charged ion source- (MCIS-) plasma can be determined from the spectrum of resonance transitions of excited neutral and ionized plasma particles. The principle of this method, which for noble gas ions involves vacuum-ultraviolet spectroscopy, is described and first measurements for a DUOPLASMATRON-ion source operated with He and Ar are presented
Additional details
Identifiers
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 23
- Journal Issue
- 2
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 967-970
- ISSN
- 0018-9499
Conference
- Title
- International conference on heavy ion sources.
- Dates
- 27 Oct 1975.
- Place
- Gatlinburg, TN, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 7258212
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON; BEAM PROFILES; DISTRIBUTION; DUOPLASMATRONS; ENERGY-LEVEL TRANSITIONS; EXCITED STATES; HELIUM; ION SOURCES; IONIZATION; MULTICHARGED IONS; PLASMA; RESONANCE; SPECTROSCOPY; ULTRAVIOLET RADIATION
- Descriptors DEC
- CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ELECTRON TUBES; ELEMENTS; ENERGY LEVELS; IONS; NONMETALS; PLASMATRONS; RADIATIONS; RARE GASES
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent