Application of diffractional lattices for light element determination in X-ray microanalyzers

An X-ray microanalyzer with diffractional lattice in the spectrometer has been developed to determine light elements. The new microanalyzer utilizes a new effective scheme of irradiation focusing based on the principle of ''crossed optics'' as well as the lattices with optimum angles of ''brilliance'', mirror-filters and highly effective open-type detectors. It is shown that the proposed microanalyzer provides an effective registration of Be, Si, Al, Li, Mg and other elements ultra-soft X-ray radiation in the range of wave lengths lambda > 10 nm. Intensity (contrast) of Be Kα-line in the standard is more than 15(5) times higher than the intensity obtained in other elements. Intensity and contrast of B and C Kα-line in the microanalyzer are sufficient for the quantitative local determination in alloys and compounds. A strong dependence of the form and intensity of ultra-soft X-ray lines on the nature of chemical bond permits to use these lines for the identification of different phases and microinclusions in alloys and compounds