Published 1995
| Version v1
Book
Microstructures of BN/SiC coatings on Nicalon fibers
Creators
- 1. Case Western Reserve Univ., Cleveland, OH (United States)
- 2. NYMA Inc., Cleveland, OH (United States). Lewis Research Center Group
Description
The microstructures of Nicalon silicon carbide (SiC) fibers and layered coatings of boron nitride (BN) followed by chemical vapor infiltrated silicon carbide (CVI-SiC) were characterized using optical and electron microscopy. Two different precursors and reactions were used to produce the BN layers while the deposition of CVI silicon carbide were nearly identical. Coated tows were examined in cross-section to characterize the chemistry and structures of the constituents and the interfaces. One BN precursor yielded three sublayers while the other gave a relatively homogeneous nanocrystalline layer
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (United States)
- ISBN
- 1-55899-266-9
- Imprint Title
- Ceramic matrix composites -- Advanced high-temperature structural materials
- Imprint Pagination
- 493 p.
- Series
- Materials Research Society symposium proceedings, Volume 365.
- Journal Page Range
- p. 383-388.
Conference
- Title
- 1994 fall meeting of the Materials Research Society (MRS).
- Dates
- 28 Nov - 2 Dec 1994.
- Place
- Boston, MA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27007675
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BORON COMPOUNDS; BORON NITRIDES; CHEMICAL COMPOSITION; CHEMICAL REACTIONS; CHEMICAL VAPOR DEPOSITION; COMPOSITE MATERIALS; ELECTRON DIFFRACTION; FABRICATION; MICROSTRUCTURE; OPTICAL MICROSCOPY; PROTECTIVE COATINGS; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY SPECTROSCOPY
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; CHEMICAL COATING; COATINGS; COHERENT SCATTERING; CRYSTAL STRUCTURE; DEPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; MATERIALS; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; SCATTERING; SILICON COMPOUNDS; SPECTROSCOPY; SURFACE COATING
Optional Information
- Secondary number(s)
- CONF-941144--.