Published June 1980 | Version v1
Report Open

Forbidden lines of highly ionized ions for localized plasma diagnostics

Description

Numerous optically forbidden lines resulting from magnetic dipole transitions in low-lying electron configurations of highly ionized Fe, Ti and Cr atoms have been identified in PLT and PDX tokamak discharges, and applied for localized diagnostics in the high-temperature (0.5 to 3.0 keV) interior of these plasmas. The measurements include determination of local ion densities and their variation in time, and of ion motions (ion temperature, plasma rotations) through Doppler effect of the lines. These forbidden lines are particularly appropriate for such measurements because under typical tokamak conditions their emissivities are quite high (1011 to 1014 photons/cm3-sec), and their relatively long wavelengths allow the use of intricate optical techniques and instrumentation. The spatial location of the emissivity is directly measurable, and tends to occur near radii where the ionization potential of the ion in question is equal to the local electron temperature. In future larger and presumably higher-temperature tokamaks analogous measurements with somewhat heavier atoms, particularly krypton, and perhaps zirconium appear both feasible and desirable

Availability note (English)

MF available from INIS under the Report Number; Available from NTIS., PC A02/MF A01.

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Additional details

Publishing Information

Imprint Pagination
20 p.
Report number
PPPL--1669

Conference

Title
3. topical conference on high temperature plasma diagnostics.
Dates
17 - 19 Mar 1980.
Place
Los Angeles, CA, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
11556604
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DOPPLER EFFECT; ELECTRON TEMPERATURE; EMISSION SPECTRA; EMISSIVITY; FORBIDDEN TRANSITIONS; ION DENSITY; PDX DEVICES; PLASMA DIAGNOSTICS; PLT DEVICES
Descriptors DEC
CLOSED PLASMA DEVICES; DIVERTORS; ENERGY-LEVEL TRANSITIONS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SPECTRA; SURFACE PROPERTIES; THERMONUCLEAR DEVICES; TOKAMAK DEVICES

Optional Information

Secondary number(s)
CONF-800320--4.