Published 1989 | Version v1
Book

Measurement of semiconductor laser linewidth enhancement factor using coherent optical feedback

  • 1. Center for High Technology Materials, Univ. of New Mexico, Albuquerque, NM (USA)

Description

The linewidth enhancement factor α of a semiconductor injection laser is defined to be the ratio of the changes in the real and imaginary parts of the complex susceptibility of the laser medium due to carrier density variations. The authors have devised a method for measuring this parameter by observing the changes in the optical frequency and external quantum efficiency due to coherent optical feedback. The wavelength dependence of α close to the room-temperature gain peak has been measured for GaAs/GaAlAs channeled-substrate-planar devices

Additional details

Publishing Information

Publisher
Society of Photo-Optical Instrumentation Engineers.
Imprint Place
Bellingham, WA (USA)
ISBN
0-8194-0078-5
Imprint Title
Laser diode technology and applications
Imprint Pagination
392 p.
Journal Page Range
p. 175-183.

Conference

Title
SPIE conference on optics, electro-optics and laser applications in science and engineering.
Acronym
OE/LASE '89
Dates
15-20 Jan 1989.
Place
Los Angeles, CA (USA).

Optional Information

Secondary number(s)
CONF-890145--.