Published 1989
| Version v1
Book
Measurement of semiconductor laser linewidth enhancement factor using coherent optical feedback
Creators
- 1. Center for High Technology Materials, Univ. of New Mexico, Albuquerque, NM (USA)
Description
The linewidth enhancement factor α of a semiconductor injection laser is defined to be the ratio of the changes in the real and imaginary parts of the complex susceptibility of the laser medium due to carrier density variations. The authors have devised a method for measuring this parameter by observing the changes in the optical frequency and external quantum efficiency due to coherent optical feedback. The wavelength dependence of α close to the room-temperature gain peak has been measured for GaAs/GaAlAs channeled-substrate-planar devices
Additional details
Publishing Information
- Publisher
- Society of Photo-Optical Instrumentation Engineers.
- Imprint Place
- Bellingham, WA (USA)
- ISBN
- 0-8194-0078-5
- Imprint Title
- Laser diode technology and applications
- Imprint Pagination
- 392 p.
- Journal Page Range
- p. 175-183.
Conference
- Title
- SPIE conference on optics, electro-optics and laser applications in science and engineering.
- Acronym
- OE/LASE '89
- Dates
- 15-20 Jan 1989.
- Place
- Los Angeles, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22005351
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM ARSENIDES; CARRIER DENSITY; COHERENT RADIATION; EMISSION SPECTRA; FABRICATION; GALLIUM ARSENIDES; LATTICE PARAMETERS; LINE WIDTHS; OPTICAL PUMPING; OPTIMIZATION; QUANTUM EFFICIENCY; SEMICONDUCTOR LASERS; VARIATIONS; WAVELENGTHS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; AMPLIFIERS; ARSENIC COMPOUNDS; ARSENIDES; EFFICIENCY; ELECTROMAGNETIC RADIATION; EQUIPMENT; GALLIUM COMPOUNDS; LASERS; PNICTIDES; RADIATIONS; SEMICONDUCTOR DEVICES; SOLID STATE LASERS; SPECTRA
Optional Information
- Secondary number(s)
- CONF-890145--.