Development of high resolution double-sided silicon detectors with projective readout

A new kind of double-sided AC-coupled silicon microstrips detectors has been developed. Ohmic separation is obtained by means of a field shaping. Experimental measurements as well as device simulations show the effectiveness of this insulation scheme. A 50 microns pitch prototype has been tested in a high-energy beam. A telescope of single-sided AC-coupled silicon microstrips detectors has been used for the precise spatial reconstruction of tracks. Spatial resolution on both sides of the double-sided microstrips detector is about 10 microns. A Monte Carlo simulation based on a charge division model in microstrip detectors has been developed. It reproduces the beam test results, and allows to predict the performances of single-, as well as double-sided, microstrips detectors. Following these results, the DELPHI collaboration at LEP is going to install two layers of these new double-sided microstrips detectors, in order to get a very precise spatial reconstruction of charged particle tracks, produced by high-energy electron-positron collisions