Published February 1991
| Version v1
Journal article
A research on the correlation between surface topography and angular distribution of sputtered atoms
Creators
- 1. Academia Sinica, Shanghai, SH (China). Shanghai Inst. of Nuclear Research
- 2. Hangzhou Univ., ZJ (China). Dept. of Physics
Description
The angular distributions of sputtered atoms of cadmium have been measured with 27 keV Ar+ ion bombardment at normal incidence with different target temperature by using collector technique and RBS analysis. After the sputtering experiment the surface structures have been observed by using scanning electron microscope. For all samples the angular distributions are over-cosine. However, the values of the deviation Δ from the cosine distribution at the axis of polar angle of 0 deg is not all the same. The deviation at the target temperature of 150 deg C, is smaller than that at room teperature. A simple model is proposed to explain the formation of the pattern of angular distribution
Additional details
Publishing Information
- Journal Title
- Acta Physica Sinica
- Journal Volume
- 40
- Journal Issue
- 2
- Series
- Acta Phys. Sin.
- Journal Page Range
- 316-322
- ISSN
- 1000-3290
- CODEN
- WLHPA
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 23033596
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANGULAR DISTRIBUTION; ARGON IONS; CADMIUM; CORRELATIONS; KEV RANGE 10-100; RUTHERFORD SCATTERING; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SURFACES; TARGETS; TEMPERATURE DEPENDENCE
- Descriptors DEC
- CHARGED PARTICLES; DISTRIBUTION; ELASTIC SCATTERING; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; IONS; KEV RANGE; METALS; MICROSCOPY; SCATTERING