Published July 2018 | Version v1
Journal article

Entanglement and decoherence in electron microscopy

  • 1. University Service Centre for Transmission Electron Microscopy, TU Wien, Wiedner Hauptstraße 8-10/E057-02, Wien 1040 (Austria)
  • 2. Institute of Solid State Physics, TU Wien, Wiedner Hauptstraße 8-10/E138, Wien 1040 (Austria)

Description

Highlights: • In spite of the fundamental interest in the subject, probe-target entanglement in the electron microscope has not been discussed up to now. • Entanglement is closely related to the von Neumann entropy, a measure of the information content of an electron scattering experiment. • The relationship between entanglement, density matrices, and coherence in electron microscopy is discussed. • An experiment to measure decoherence times on the order of nanoseconds is proposed. This is especially important in view of recent developments in time resolved electron microscopy. - Abstract: Interaction of the probe with the specimen in an electron microscope inevitably leads to entanglement between the probe and the scatterer. In spite of the importance of entanglement in many areas of modern physics, this subject has not been touched in the literature. Here, we develop some ideas about entanglement in electron microscopy for a number of scattering mechanisms. The relationship between entropy, density matrices, and coherence is discussed. In addition, we explore the questions "Why is Bragg scattering coherent and energy loss incoherent?" and "When does decoherence play a role?" It seems to be possible to measure decoherence on extremely short timescales of 108s. This is especially important in view of recent developments in ultrafast electron microscopy.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2018.04.007

Additional details

Identifiers

DOI
10.1016/j.ultramic.2018.04.007;
PII
S0304399118300597;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
190
Journal Page Range
p. 39-44
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
50052261
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
DENSITY MATRIX; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ENERGY LOSSES; ENTROPY; INFORMATION; PROBES; QUANTUM ENTANGLEMENT; SCATTERING
Descriptors DEC
LOSSES; MATRICES; MICROSCOPES; MICROSCOPY; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.