Published January 2001
| Version v1
Journal article
Quantitative X-ray methods of amorphous content and crystallinity determination of SiO2, in Quartz and Opal mixture
Creators
- Ketabdari, M.R.
- Ahmadi, K.
- Esmaeilnia Shirvani, A.
- Tofigh, A.
- Atomic Energy Organization of Iran, Laboratory Exploration Division, Tehran (Iran, Islamic Republic of)
- Atomic Energy Organization of Iran, Laboratory Exploration Division, Tehran (Iran, Islamic Republic of)
- Shahid Beheshti University, Faculty of Sciences, Tehran (Iran, Islamic Republic of)
- NIOC Research Institute of Petroleum Industry, Tehran (Iran, Islamic Republic of)
Description
X-ray diffraction technique is commonly used for qualitative analysis of minerals, and has also been successfully used for quantitative measurements. In this research, the matrix flushing and a new X-ray diffraction method have been used for the determination of crystallinity and amorphous content of Opal and Quartz mixture. The PCAPD is used to determine the quantitative analysis of these two minerals
Availability note (English)
Available from Atomic Energy Organization of IranAdditional details
Additional titles
- Original title (Persian)
- Analiz-e kammi-va ta'een-e maghadir-e mavvad-e bishekl va boluri-ye SiO
Publishing Information
- Journal Title
- Iranian Journal of Crystallography and Mineralogy
- Journal Volume
- 9
- Journal Issue
- 2
- Journal Page Range
- p. 79-92
- ISSN
- 1726-3689
INIS
- Country of Publication
- Iran, Islamic Republic of
- Country of Input or Organization
- Iran, Islamic Republic of
- INIS RN
- 34000590
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- AMORPHOUS STATE; CRYSTALLOGRAPHY; OPALS; QUARTZ; STRUCTURAL CHEMICAL ANALYSIS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SILICA; SILICON COMPOUNDS; SILICON OXIDES