Published May 12, 2003
| Version v1
Journal article
Optical nanowriting on azobenzene side-chain polymethacrylate thin films by near-field scanning optical microscopy
Creators
- 1. INFM and Dipartimento di Fisica della Materia e Tecnologie Fisiche Avanzate, Universita di Messina, Salita Sperone 31, I-98166 Messina (Italy)
- 2. INFM and Dipartimento di Fisica 'Enrico Fermi', Universita di Pisa, Via F. Buonarroti 2, I-56127 Pisa (Italy)
Description
Optical writing and subsequent reading of information on thin films of azobenzene side-chain polymethacrylates on the 100-nm scale are demonstrated by near-field scanning optical microscopy (NSOM) with polarization control. Polarized blue light at 488 nm coupled to the NSOM aperture probe activates trans-cis-trans isomerization cycles of the side chains, causing their alignment and thus locally inducing optical birefringence. Red light at 690 nm with modulated polarization is coupled to the same aperture and used to detect optical anisotropy on the local scale. Lines of width on the 100-nm scale were optically inscribed and detected even with no concurrent topographic modification
Additional details
Identifiers
- DOI
- 10.1063/1.1572538;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 82
- Journal Issue
- 19
- Journal Page Range
- p. 3313-3315
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35037693
- Subject category
- S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- AZO COMPOUNDS; BIREFRINGENCE; ISOMERIZATION; NANOSTRUCTURES; OPTICAL PROPERTIES; PHOTOCHEMISTRY; PMMA; POLARIZATION; SCANNING LIGHT MICROSCOPY; THIN FILMS
- Descriptors DEC
- CHEMICAL REACTIONS; CHEMISTRY; ESTERS; FILMS; MICROSCOPY; OPTICAL MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC NITROGEN COMPOUNDS; ORGANIC POLYMERS; PHYSICAL PROPERTIES; POLYACRYLATES; POLYMERS; POLYVINYLS; REFRACTION
Optional Information
- Notes
- (c) 2003 American Institute of Physics.