Published February 2007
| Version v1
Journal article
Integrated characterization of cold sprayed aluminum coatings
Creators
- 1. Materials Science and Engineering, Heavy Engineering 130, State University of New York, Stony Brook, New York (United States)
- 2. NIST Center for Neutron Research, 100 Bureau Drive, Gaithersburg, MD 20899 (United States)
- 3. Applied Systems and Materials Science Department, Sandia National Laboratories, Albuquerque, NM 87185-0549 (United States)
Description
Cold spray (CS) technology is a recent development for producing dense, oxide-free metallic and cermet coatings with attributes not achievable by established atmospheric thermal spray (TS) techniques. Little or no thermal component (i.e. high temperature) is introduced in the CS process; deposit formation relies mainly on dynamic compaction as particles impact the substrate. In this paper, we discuss and evaluate the relationships between the microstructure, properties and residual stresses in CS Al coatings, combining indentation, dilatometry, resistivity measurements and neutron diffraction techniques. In addition, we provide mechanistic arguments for the evolution of such characteristics with post-deposit annealing
Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2006.09.006;
- PII
- S1359-6454(06)00663-X;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 55
- Journal Issue
- 3
- Journal Page Range
- p. 857-866
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39034681
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM; ANNEALING; CERMETS; COATINGS; DILATOMETRY; DUCTILITY; MICROSTRUCTURE; NEUTRON DIFFRACTION; PARTICLES; RESIDUAL STRESSES
- Descriptors DEC
- COHERENT SCATTERING; COMPOSITE MATERIALS; DIFFRACTION; ELEMENTS; HEAT TREATMENTS; MATERIALS; MECHANICAL PROPERTIES; METALS; SCATTERING; STRESSES; TENSILE PROPERTIES; THERMAL ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.