High pressure ESR and other complementary studies of copper trimers with the quartet spin ground state
Description
The intriguing, earlier observed, temperature shift of the X-band ESR magnetic field Hres was studied for powder samples of linear Cu3EtBz·2MeOH and Cu3BuNaEs·2MeOH trimeric Cu(II) complexes. For Cu3BuNaEs·2MeOH, Hres changes dramatically at ∼100 K, where a crystallographic phase transition was found by X-ray diffraction. For Cu3EtBz·2MeOH, ESR measurements were performed under high pressure. It was observed that Hres decreases with increasing pressure but the linewidth increases. Far-infrared absorption measurements were performed as a function of temperature for Cu3EtBz·2MeOH and Cu3BuNaEs·2MeOH. No clear change of vibration frequencies with temperature was observed. These results agree with the earlier interpretation that the temperature shift of Hres is caused by the thermal averaging of ESR lines due to the short spin-lattice relaxation time
Additional details
Identifiers
- PII
- S0304885301004565;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 236
- Journal Issue
- 3
- Journal Page Range
- p. 347-356
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34002968
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; COPPER COMPLEXES; COPPER COMPOUNDS; CRYSTAL-PHASE TRANSFORMATIONS; ELECTRON SPIN RESONANCE; FAR INFRARED RADIATION; GROUND STATES; HIGH PRESSURE; MAGNETIC FIELDS; MEASURING METHODS; PRESSURE DEPENDENCE; RELAXATION TIME; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0065-0273 K; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; COMPLEXES; DIFFRACTION; ELECTROMAGNETIC RADIATION; ENERGY LEVELS; INFRARED RADIATION; MAGNETIC RESONANCE; PHASE TRANSFORMATIONS; RADIATIONS; RESONANCE; SCATTERING; SORPTION; TEMPERATURE RANGE; TRANSITION ELEMENT COMPLEXES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.