Highly ordered amorphous silicon-carbon alloys obtained by RF PECVD
- 1. Sao Paulo Univ., SP (Brazil). Escola Politecnica. Dept. de Engenharia de Sistemas Eletronicos
- 2. Sao Paulo Univ., SP (Brazil). Inst. de Fisica
Description
We have shown that close to stoichiometry RF PECVD amorphous silicon carbon alloys deposited under silane starving plasma conditions exhibit a tendency towards c-Si C chemical order. Motivated by this trend, we further explore the effect of increasing RF power and H2 dilution of the gaseous mixtures, aiming to obtain the amorphous counterpart of c-Si C by the RF-PECVD technique. Doping experiments were also performed on ordered material using phosphorus and nitrogen as donor impurities and boron and aluminum as acceptor ones. For nitrogen a doping efficiency close to device quality a-Si:H was obtained, the lower activation energy being 0,12 eV with room temperature dark conductivity of 2.10-3 (Ω.cm). Nitrogen doping efficiency was higher than phosphorous for all studied samples. For p-type doping, results indicate that, even though the attained conductivity values are not device levels, aluminum doping conducted to a promising shift in the Fermi level. Also, aluminum resulted a more efficient acceptor than boron, in accordance to observations in crystalline Si C material. (author)
Additional details
Publishing Information
- Journal Title
- Brazilian Journal of Physics
- Journal Volume
- 30
- Journal Issue
- 3
- Journal Page Range
- p. 533-540
- ISSN
- 0103-9733
- CODEN
- BJPHE6
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 34083676
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMORPHOUS STATE; CHEMICAL VAPOR DEPOSITION; CRYSTAL DOPING; ELECTRIC CONDUCTIVITY; FINE STRUCTURE; IMPURITIES; NITROGEN ADDITIONS; RF SYSTEMS; SILICON CARBIDES; THIN FILMS; X-RAY SPECTRA
- Descriptors DEC
- ALLOYS; CARBIDES; CARBON COMPOUNDS; CHEMICAL COATING; DEPOSITION; ELECTRICAL PROPERTIES; FILMS; PHYSICAL PROPERTIES; SILICON COMPOUNDS; SPECTRA; SURFACE COATING
Optional Information
- Notes
- 16 refs., 2 tabs., 10 graphs