Latest depleted CMOS sensor developments in the CERN RD50 collaboration
Creators
- 1. Instituto de Fisica Corpuscular (IFIC), Consejo Superior de Investigaciones Cientificas (CSIC), Universitat de Valencia, Valencia (Spain)
Description
This contribution summarizes the most recent activities carried out within the CERN RD50 collaboration with regard to Depleted Monolithic Active Pixel Sensors (DMAPS). In particular, these activities have been focused on the characterization of the RD50-MPW2 prototype. RD50-MPW2 is the second DMAPS prototype developed in the 150 nm HV-CMOS technology process from LFoundry. The main characteristics of the RD50-MPW2 design will be reviewed. The leakage current, breakdown voltage and Edge Transient Current Technique (E-TCT) measurements of the RD50-MPW2 test structures will be presented. The characterization of the RD50-MPW2 active matrix and its readout electronics will be also described. Finally, the initial characteristics of the new RD50-MPW3 DMAP sensor prototype being designed at present by the CERN-RD50 collaboration will be shown. (author)
Availability note (English)
Available from DOI: https://doi.org/10.7566/JPSCP.34.010008Additional details
Identifiers
Publishing Information
- Publisher
- Physical Society of Japan
- Imprint Place
- Tokyo (Japan)
- ISBN
- 978-4-89027-147-4
- Imprint Title
- Proceedings of the 29th International Workshop on Vertex Detectors (VERTEX2020)
- Imprint Pagination
- [203 p.]
- Journal Page Range
- p. 010008.1-010008.9
Conference
- Title
- 29. international workshop on vertex detectors
- Acronym
- VERTEX2020
- Dates
- 5-8 Oct 2020
- Place
- Tsukuba, Ibaraki (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 53061302
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CERN; CMOS CIRCUITS; ELECTRICAL FAULTS; ELECTRODES; IRRADIATION; LASER RADIATION; LEAKAGE CURRENT; MEMORY DEVICES; NEUTRON FLUENCE; PERMITTIVITY; PHYSICAL RADIATION EFFECTS; READOUT SYSTEMS; SILICON DIODES; SPACE CHARGE
- Descriptors DEC
- CURRENTS; DIELECTRIC PROPERTIES; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; INTEGRATED CIRCUITS; INTERNATIONAL ORGANIZATIONS; MICROELECTRONIC CIRCUITS; PHYSICAL PROPERTIES; RADIATION EFFECTS; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES
Optional Information
- Notes
- 9 refs., 9 figs.; This symposium was held online