Published June 2009
| Version v1
Journal article
Development of irradiance monitoring system on the micro scanning PIXE
Creators
- 1. National Inst. of Radiological Sciences, Fundamental Technology Center, Chiba, Chiba (Japan)
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Hoshasen Kagaku
- Journal Volume
- 52
- Journal Issue
- 6
- Journal Page Range
- p. 5-8
- ISSN
- 0441-2540
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 41004515
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- BEAM OPTICS; BEAM PROFILES; BEAM SCANNERS; CARBON; IRRADIATION; MEASURING METHODS; PERFORMANCE TESTING; PIXE ANALYSIS; RADIATION DOSES; RESOLUTION; SECONDARY EMISSION; THIN FILMS
- Descriptors DEC
- BEAM MONITORS; CHEMICAL ANALYSIS; DOSES; ELEMENTS; EMISSION; FILMS; MEASURING INSTRUMENTS; MONITORS; NONDESTRUCTIVE ANALYSIS; NONMETALS; TESTING; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 14 refs., 6 figs.