On the effect of thin layers of structural material on the albedo of flat isotopic and flat monodirectional cesium sources
Creators
Description
The value of albedo is determined for the case when there are thin layers of structural materials, different from that of shield, between the source and the shield of the installation. For an isotropic source of γ-radiation the cases of lead shield screening by iron layers of various thickness, and also of iron (steel) shield by lead layers of the same thickness are considered. For comparison, the albedo of these substances is computed without screening. The results obtained testify to the fact that the characteristics of radiation reflected at small (0-10 deg) angles with respect to the shield surface are determined by the inner layer. As the angle of reflection increases, the effect of structural layers diminishes. For a flat monodirected cesium source it is established that the value of albedo begins to be determined by the structural layer only for sufficiently large thicknesses of the inner layer. A formula for the computation of the relative error of the results obtained is given. The maximum error is approximately 5%
Additional details
Additional titles
- Original title (Russian)
- О влиянии тонких конструктивных слоев на величину альбедо для плоскикого изотропного и плоского мононаправленного цезиевых источников
Publishing Information
- Imprint Title
- Radiation technology
- Journal Issue
- no. 11
- Series
- Voprosy atomnoj nauki i tekhniki.
- Journal Page Range
- p. 8-12.
- Report number
- INIS-mf--4645
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 10433312
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Descriptors DEI
- ALBEDO; ANGULAR CORRELATION; BIOLOGICAL SHIELDING; GAMMA RADIATION; IRON; LAYERS; LEAD; SHIELDING MATERIALS; THICKNESS
- Descriptors DEC
- CORRELATIONS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; METALS; RADIATIONS; SHIELDING; TRANSITION ELEMENTS
Optional Information
- Notes
- Imprint:Radiatsionnaya tekhnika.