Published November 15, 2006
| Version v1
Journal article
Growth of Ag thin films on ZnO(0 0 0 -1) investigated by AES and STM
- 1. Interuniversity Microelectronic Center (IMEC), SPDT-MCA, Kapeldreef 75, B-3001 Leuven (Belgium)
- 2. Laboratoire de Physique des Materiaux Electroniques (LPME), University of Namur, Rue de Bruxelles 61, B-5000 Namur (Belgium)
- 3. Dpto. Fisica Aplicada y Electromagnetismo c/Dr. Moliner no. 50, 46100 Burjassot, Valencia (Spain)
- 4. Centre de Recherche sur l'HeteroEpitaxie et ses Applications (CRHEA), CNRS, Rue Bernard Gregory, F-06560 Valbonne Sophia-Antipolis (France)
Description
The growth of Ag films on ZnO(0 0 0 -1) has been investigated by Auger electron spectroscopy (AES) and scanning tunneling microscopy (STM). A high density of islands is nucleated at the earliest stages of the growth. An upstepping mechanism causes these islands to coalesce while the uncovered fraction of the ZnO surface remains constant (30%)
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2005.12.119;
- PII
- S0169-4332(05)01775-7;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 253
- Journal Issue
- 2
- Journal Page Range
- p. 549-554
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38106108
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AUGER ELECTRON SPECTROSCOPY; CRYSTAL GROWTH; SCANNING TUNNELING MICROSCOPY; SILVER; SURFACES; THIN FILMS; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; SPECTROSCOPY; TRANSITION ELEMENTS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.