Published December 14, 2020 | Version v1
Journal article

Bright, polarization-tunable high repetition rate extreme ultraviolet beamline for coincidence electron–ion imaging

  • 1. Université de Bordeaux-CNRS-CEA, CELIA, UMR5107, F33405 Talence (France)
  • 2. Amplitude Laser Group, 33600 Pessac (France)
  • 3. Department of Physical Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, 14195 Berlin (Germany)

Description

After decades of supremacy of the Titanium:Sapphire technology, Ytterbium-based high-order harmonic sources are emerging as a promising alternative for experiments requiring high flux of ultrashort extreme ultraviolet (XUV) radiation. In this article we describe a versatile experimental setup delivering XUV photons in the 10–50 eV range. The use of cascaded high-order harmonic generation enables us to reach 1.9 mW of average power at 18 eV. Several spectral selection schemes are presented, to isolate a single high-harmonic or a group of them. In the perspective of circular dichroism experiments, we produce highly elliptical XUV radiation using resonant elliptical high-harmonic generation, and circularly polarized XUV by bichromatic bicircular high-harmonic generation. As an illustration of the capacities of the beamline, we focus the XUV beam in a coincidence electron–ion imaging spectrometer, where we measure the photoelectron momentum angular distributions of xenon monomers and dimers. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6455/abbe27

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Physics. B, Atomic, Molecular and Optical Physics
Journal Volume
53
Journal Issue
23
Journal Page Range
[14 p.]
ISSN
0953-4075
CODEN
JPAPEH