Influence of nitrogen on the optical properties of particles in a low pressure argon-silane radio-frequency discharge
Description
In the last few years, laboratory dusty plasmas have been actively studied in connection with in pollution control in plasma reactors for surface treatments. An increasing interest is now devoted to the positive aspect of tailored microparticulates with applications in several technological areas. Light scattering, in the Mie regime, is used to determine by in situ-diagnostics both size and optical index values. From multi angles and crossed polarization data, size and optical indices have been obtained. Size determination in the range (40-110 nm) are compared with direct measurements from ex-situ T.E.M. (Transmission Electronic Microscopy) analysis for particulates growth in an ArSiH4 RF reactor. The material modifications of the particulates due to an addition of nitrogen have been evidenced by Mie scattering data in the two situations of simultaneous or delayed nitrogen pulsed gas flows
Additional details
Publishing Information
- Publisher
- Stevens Institute of Technology.
- Imprint Place
- Hoboken, NJ (United States)
- Imprint Title
- XXII International conference on phenomena in ionized gases. Contributed papers 1
- Imprint Pagination
- 172 p.
- Journal Page Range
- p. 111-112.
Conference
- Title
- 22. international conference on phenomena in ionized gases.
- Dates
- 31 Jul - 4 Aug 1995.
- Place
- Hoboken, NJ (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27052456
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON; HIGH-FREQUENCY DISCHARGES; LIGHT SCATTERING; NITROGEN; OPTICAL PROPERTIES; SILANES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ELECTRIC DISCHARGES; ELECTRON MICROSCOPY; ELEMENTS; HYDRIDES; HYDROGEN COMPOUNDS; MICROSCOPY; NONMETALS; PHYSICAL PROPERTIES; RARE GASES; SCATTERING; SILICON COMPOUNDS
Optional Information
- Secondary number(s)
- CONF-950749--.