Field emission property of multi-cathode electron sources with vertically aligned CNT arrays
- 1. Department of Information Display, Kyung Hee University, Seoul (Korea, Republic of)
Description
Carbon nanotube (CNT)-based cold cathode has been used as an efficient electron emitter owing to its high electrical conductivity and unique structural feature of high aspect ratio. However, conventional CNT-based cold cathode with diode electrode configuration restricts the applicable range of the CNT cold cathode. Here, we present the systematic investigation of electron beam property and I-V characteristic of various CNT-based multi-emitter system for advanced electron emitting devices capable of large areal applications. Single emitter island, consisting of well-defined N x N CNT strands, shows high maximum current value, low turn-on voltage and large electron beam diameter with increase of N value. For the multi-emitter system consisting multi-islands, a critical pitch size of multi-emitter system is found to obtain separated electron beam for each island without significant interference between electrons departing from each island. (author)
Availability note (English)
Available from DOI: https://doi.org/10.35848/1347-4065/ac2396Additional details
Identifiers
Publishing Information
- Journal Title
- Japanese Journal of Applied Physics (Online)
- Journal Volume
- 60
- Journal Issue
- 10
- Journal Page Range
- p. 105002.1-105002.7
- ISSN
- 1347-4065
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 53108609
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ASPECT RATIO; CARBON NANOTUBES; CHEMICAL VAPOR DEPOSITION; CRYSTALLOGRAPHY; ELECTRIC CONDUCTIVITY; ELECTRODES; ELECTRON BEAMS; FIELD EMISSION; MAGNETRONS; PLASMA TECHNOLOGY; RF SYSTEMS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DIODES; SILICON COMPOUNDS; SPUTTERING
- Descriptors DEC
- BEAMS; CARBON; CHEMICAL COATING; DEPOSITION; DIMENSIONLESS NUMBERS; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EMISSION; EQUIPMENT; LEPTON BEAMS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NANOSTRUCTURES; NANOTUBES; NONMETALS; PARTICLE BEAMS; PHYSICAL PROPERTIES; SEMICONDUCTOR DEVICES; SURFACE COATING
Optional Information
- Notes
- 23 refs., 6 figs.