Published July 1990
| Version v1
Journal article
CEMS characterization of Kr++ irradiated Fe-Pd bilayers
- 1. Padua Univ. (Italy). Dipt. di Ingegneria Meccanica
- 2. Venice Univ. (Italy). Dipt. di Chimica Fisica
- 3. Padua Univ. (Italy). Dipt. di Fisica
- 4. Istituto Nazionale di Fisica Nucleare, Padua (Italy). Lab. di Legnaro
Description
Ion beam mixing in Fe-Pd bilayers evaporated onto SiO2 substrates has been studied using Rutherford backscattering spectrometry and Moessbauer spectroscopy. To achieve some depth selectivity in the Moessbauer measurements, a 5 nm thick 57Fe layer was evaporated at either the Pd-Fe interface or the Fe-substrate interface. A disordered FePd3 phase is formed predominantly in the mixed region. The underlying unmixed Fe layer does not undergo any structural phase transformation. (orig.)
Additional details
Publishing Information
- Journal Title
- Hyperfine Interactions
- Journal Volume
- 56
- Journal Issue
- 1-4
- Series
- Hyperfine Interact.
- Journal Page Range
- 1587-1592
- ISSN
- 0304-3843
- CODEN
- HYIND
Conference
- Title
- International conference on the applications of the Moessbauer effect (ICAME '89) and exhibit.
- Dates
- 4-8 Sep 1989.
- Place
- Budapest (Hungary).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Switzerland
- INIS RN
- 22005939
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CHEMICAL COMPOSITION; EXPERIMENTAL DATA; INTERMETALLIC COMPOUNDS; INTERNAL CONVERSION; ION IMPLANTATION; IRON; KEV RANGE 100-1000; KRYPTON IONS; MOESSBAUER EFFECT; PALLADIUM; PHYSICAL RADIATION EFFECTS; RADIATION DOSES; RUTHERFORD SCATTERING; SILICON OXIDES; SUBSTRATES
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; CHARGED PARTICLES; CONVERSION; DATA; DECAY; ELASTIC SCATTERING; ELEMENTS; ENERGY RANGE; INFORMATION; IONS; KEV RANGE; METALS; NUCLEAR DECAY; NUMERICAL DATA; OXIDES; OXYGEN COMPOUNDS; PLATINUM METALS; RADIATION EFFECTS; SCATTERING; SILICON COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Contract/Grant/Project number
- Contract CEC SC1-0024-C(A)