Phase-modulated spectroscopic ellipsometry and polarized transmission intensity studies of wide-gap biaxial CaGa2S4
Creators
Description
Differently prepared natural (100)-oriented cleavage planes of the orthorhombic wide-gap (Eo∼4.1 eV) single crystalline CaGa2S4 were examined in two symmetric positions at room temperature over the photon energies 0.8-6.5 eV by spectroscopic ellipsometry. Complimentary, polarized transmission intensity technique was applied. The data obtained by both techniques were further treated within standard biaxial approach and the major refraction indices were restored for the practically important range below energy gap. The structure and polarization peculiarities of the obtained pseudo-dielectric function were related with apparently four critical points of interband electronic transitions in ZZ (E1=4.49 eV, E3=5.34 eV) and YY (E2=5.00 eV, E4=6.21 eV) configurations, respectively
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2004.01.010;
- PII
- S0040609004000112;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 455-456
- Journal Issue
- 3
- Journal Page Range
- p. 244-247
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 3. international conference on spectroscopic ellipsometry
- Dates
- 6-11 Jul 2003
- Place
- Vienna (Austria)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37016813
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CALCIUM SULFIDES; DIELECTRIC MATERIALS; ELLIPSOMETRY; ENERGY GAP; EV RANGE 01-10; GALLIUM SULFIDES; MONOCRYSTALS; POLARIZATION; REFRACTIVE INDEX; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CALCIUM COMPOUNDS; CHALCOGENIDES; CRYSTALS; ENERGY RANGE; EV RANGE; GALLIUM COMPOUNDS; MATERIALS; MEASURING METHODS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SULFIDES; SULFUR COMPOUNDS; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.