Published May 1, 2004 | Version v1
Journal article

Phase-modulated spectroscopic ellipsometry and polarized transmission intensity studies of wide-gap biaxial CaGa2S4

Description

Differently prepared natural (100)-oriented cleavage planes of the orthorhombic wide-gap (Eo∼4.1 eV) single crystalline CaGa2S4 were examined in two symmetric positions at room temperature over the photon energies 0.8-6.5 eV by spectroscopic ellipsometry. Complimentary, polarized transmission intensity technique was applied. The data obtained by both techniques were further treated within standard biaxial approach and the major refraction indices were restored for the practically important range below energy gap. The structure and polarization peculiarities of the obtained pseudo-dielectric function were related with apparently four critical points of interband electronic transitions in ZZ (E1=4.49 eV, E3=5.34 eV) and YY (E2=5.00 eV, E4=6.21 eV) configurations, respectively

Additional details

Identifiers

DOI
10.1016/j.tsf.2004.01.010;
PII
S0040609004000112;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
455-456
Journal Issue
3
Journal Page Range
p. 244-247
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
3. international conference on spectroscopic ellipsometry
Dates
6-11 Jul 2003
Place
Vienna (Austria)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37016813
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CALCIUM SULFIDES; DIELECTRIC MATERIALS; ELLIPSOMETRY; ENERGY GAP; EV RANGE 01-10; GALLIUM SULFIDES; MONOCRYSTALS; POLARIZATION; REFRACTIVE INDEX; TEMPERATURE RANGE 0273-0400 K
Descriptors DEC
ALKALINE EARTH METAL COMPOUNDS; CALCIUM COMPOUNDS; CHALCOGENIDES; CRYSTALS; ENERGY RANGE; EV RANGE; GALLIUM COMPOUNDS; MATERIALS; MEASURING METHODS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SULFIDES; SULFUR COMPOUNDS; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.