Published October 1, 1979 | Version v1
Miscellaneous

COREL, Ion Implantation in Solids, Range, Straggling Using Thomas-Fermi Cross-Sections. RASE4, Ion Implantation in Solids, Range, Straggling, Energy Deposition, Recoils. DAMG2, Ion Implantation in Solids, Energy Deposition Distribution with Recoils

Description

1 - Description of problem or function: COREL calculates the final average projected range, standard deviation in projected range, standard deviation in locations transverse to projected range, and average range along path for energetic atomic projectiles incident on amorphous targets or crystalline targets oriented such that the projectiles are not incident along low index crystallographic axes or planes. RASE4 calculates the instantaneous average projected range, standard deviation in projected range, standard deviation in locations transverse to projected range, and average range along path for energetic atomic projectiles incident on amorphous targets or crystalline targets oriented such that the projectiles are not incident along low index crystallographic axes or planes. RASE4 also calculates the instantaneous rate at which the projectile is depositing energy into atomic processes (damage) and into electronic processes (electronic excitation), the average range of target atom recoils projected onto the direction of motion of the projectiles, and the standard deviation in the recoil projected range. DAMG2 calculates the distribution in depth of the energy deposited into atomic processes (damage), electronic processes (electronic excitation), or other energy-dependent quality produced by energetic atomic projectiles incident on amorphous targets or crystalline targets oriented such that the projectiles are not incident along low index crystallographic axes or planes. 2 - Method of solution: COREL: The truncated differential equation which governs the several variables being sought is solved through second-order by trapezoidal integration. The energy-dependent coefficients in the equation are obtained by rectangular integration over the Thomas-Fermi elastic scattering cross section. RASE4: The truncated differential equation which governs the range and straggling variables is solved through second-order by trapezoidal integration. The energy-dependent coefficients in the equation, the energy deposition rates, and the recoil range and straggling variables are obtained by rectangular integration over the Thomas-Fermi elastic scattering cross section. DAMG2: The integral which governs the depth distribution of interest is evaluated by rectangular integration. Energy redistribution by the recoiling target atoms is included in a Gaussian approximation. 3 - Restrictions on the complexity of the problem: COREL and RASE4: Compound targets with up to four different atomic constituents may be considered. The maximum incident energy which may be used is 800 times the Lindhard characteristic energy, a quantity which depends on the mass and atomic number of the incident projectile and the target atoms. Maximum incident energy can be increased by increasing storage area available for the program, and increasing the dimensions of the energy-dependent arrays

Availability note (English)

Available on-line: http://www.nea.fr/abs/html/nesc0758.html

Additional details

Publishing Information

Imprint Pagination
[html]

INIS

Country of Publication
Nuclear Energy Agency of the OECD (NEA)
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41075940
Subject category
S97: MATHEMATICAL METHODS AND COMPUTING; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Computer Program Description, Non-conventional Literature
Descriptors DEI
APPROXIMATIONS; ATOMIC NUMBER; C CODES; COMPUTER PROGRAM DOCUMENTATION; CROSS SECTIONS; CRYSTALLOGRAPHY; D CODES; DIFFERENTIAL EQUATIONS; ELASTIC SCATTERING; ENERGY DEPENDENCE; EXCITATION; ION IMPLANTATION; R CODES; RADIATION EFFECTS; SLOWING-DOWN; SPATIAL DISTRIBUTION; THOMAS-FERMI MODEL; WEBSITES
Descriptors DEC
ATOMIC MODELS; CALCULATION METHODS; COMPUTER CODES; DISTRIBUTION; DOCUMENT TYPES; ENERGY-LEVEL TRANSITIONS; EQUATIONS; MATHEMATICAL MODELS; SCATTERING

Optional Information

Notes
3 refs.