Published May 10, 1979 | Version v1
Patent

Plasma position measuring instrument for tokamak device

Description

Purpose: To improve precision and safety of plasma position control by detecting abnormal signals from adjacent magnetic probes (by utilizing the fact that tangential and radial fields are smooth relative to a circumferential angle) and correcting the position measurements. Constitution: Signals from a plurality of plasma position detecting magnetic probes are converted to digital signals by an A-D convertor, before fed to an instantaneous abnormal detector. Tangential and radial field configurations of each probe are smooth relative to a circumferential angle. Measurements fed into the detector are compared with those of an adjacent probe. A stationary abnormal detector integrates the number of abnormality detections on each abnormal case, and when the integrated number surpass a limit, an alarm output part makes an alarm to personnel and emits a position calculation formula correction signal to the plasma position detector so that abnormal measurements are excluded from the measuring data. (Nakamura, S.)

Availability note (English)

Available from JAPATIC. Also available from INPADOC.

Additional details

Publishing Information

Imprint Pagination
4 p.
IPC:
Int. Cl. H05H1/12; G21B1/00.
IPC
Int. Cl. H05H1/12; G21B1/00.
Patent number
JP patent document 54-58198/A/

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
11539499
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
CORRELATIONS; MAGNETIC FIELD CONFIGURATIONS; MAGNETIC PROBES; PLASMA DIAGNOSTICS; SIGNALS; TOKAMAK DEVICES
Descriptors DEC
CLOSED PLASMA DEVICES; PROBES; THERMONUCLEAR DEVICES