Published April 1, 2014 | Version v1
Journal article

Morphological and structural characterization of Sm–O–S compounds prepared by thermolysis of dithiocarbamate precursors

  • 1. Italian National Research Council, Institute for Microelectronics and Microsystems, Lecce (Italy)
  • 2. Mathematical and Physics Department "E. De Giorgi", University of Salento, via Arnesano, 73100 Lecce (Italy)
  • 3. Dipartimento Ingegneria Innovazione, University of Lecce, Lecce (Italy)

Description

Deposition and structural characterization of SmxSyOz-based thin films are reported. The chemical synthesis of the SmxSyOz compounds is performed by thermolysis of dithiocarbamate precursors, followed by the drop casting deposition of the synthesized material, and by the thermal treatment at different temperatures (250 °C, 500 °C and 900 °C) and atmospheric conditions (nitrogen and air). Structural and morphological properties have been investigated by scanning electron microscopy, transmission electron microscopy and X-ray diffraction, and were found to depend closely on the treatment conditions. In particular, the treatment at temperatures as high as 900 °C and in a nitrogen atmosphere enhances the crystalline nature of the films and increases the samarium content in comparison to the oxygen content. Therefore, the temperature of 900 °C and the nitrogen atmosphere represent the optimal treatment conditions, among the process parameters, to obtain a single phase of Sm2SO2. - Highlights: • Sm–O–S compounds have been synthesized by a simple and low cost chemical route. • The films were treated at different temperatures and different atmospheres. • The film structure and chemical composition were studied. • SmxOySz physical properties were tuned with temperature and atmosphere treatment. • At 900 °C in nitrogen atmosphere a single phase of Sm2O2S is obtained

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2014.01.085

Additional details

Identifiers

DOI
10.1016/j.tsf.2014.01.085;
PII
S0040-6090(14)00116-3;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
556
Journal Page Range
p. 241-246
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.