Morphological and structural characterization of Sm–O–S compounds prepared by thermolysis of dithiocarbamate precursors
Creators
- 1. Italian National Research Council, Institute for Microelectronics and Microsystems, Lecce (Italy)
- 2. Mathematical and Physics Department "E. De Giorgi", University of Salento, via Arnesano, 73100 Lecce (Italy)
- 3. Dipartimento Ingegneria Innovazione, University of Lecce, Lecce (Italy)
Description
Deposition and structural characterization of SmxSyOz-based thin films are reported. The chemical synthesis of the SmxSyOz compounds is performed by thermolysis of dithiocarbamate precursors, followed by the drop casting deposition of the synthesized material, and by the thermal treatment at different temperatures (250 °C, 500 °C and 900 °C) and atmospheric conditions (nitrogen and air). Structural and morphological properties have been investigated by scanning electron microscopy, transmission electron microscopy and X-ray diffraction, and were found to depend closely on the treatment conditions. In particular, the treatment at temperatures as high as 900 °C and in a nitrogen atmosphere enhances the crystalline nature of the films and increases the samarium content in comparison to the oxygen content. Therefore, the temperature of 900 °C and the nitrogen atmosphere represent the optimal treatment conditions, among the process parameters, to obtain a single phase of Sm2SO2. - Highlights: • Sm–O–S compounds have been synthesized by a simple and low cost chemical route. • The films were treated at different temperatures and different atmospheres. • The film structure and chemical composition were studied. • SmxOySz physical properties were tuned with temperature and atmosphere treatment. • At 900 °C in nitrogen atmosphere a single phase of Sm2O2S is obtained
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2014.01.085Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2014.01.085;
- PII
- S0040-6090(14)00116-3;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 556
- Journal Page Range
- p. 241-246
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47003406
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHEMICAL COMPOSITION; COMPARATIVE EVALUATIONS; DEPOSITION; HEAT TREATMENTS; MICROSTRUCTURE; NITROGEN; SAMARIUM OXIDES; SAMARIUM SULFIDES; SCANNING ELECTRON MICROSCOPY; SYNTHESIS; TEMPERATURE DEPENDENCE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; EVALUATION; FILMS; MICROSCOPY; NONMETALS; OXIDES; OXYGEN COMPOUNDS; RARE EARTH COMPOUNDS; SAMARIUM COMPOUNDS; SCATTERING; SULFIDES; SULFUR COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.