Published January 30, 2008 | Version v1
Journal article

Electrical characterization of organic-on-inorganic semiconductor Schottky structures

  • 1. Department of Physics, Faculty of Sciences and Arts, Atatuerk University, Erzurum (Turkey)
  • 2. Department of Physics, Faculty of Sciences and Arts, Dicle University, Diyarbakir (Turkey)

Description

We prepared a methyl red/p-InP organic-inorganic (OI) Schottky device formed by evaporation of an organic compound solution directly to a p-InP semiconductor wafer. The value of the optical band gap energy of the methyl red organic film on a glass substrate was obtained as 2.0 eV. It was seen that the Al/methyl red/p-InP contacts showed a good rectifying behavior. An ideality factor of 2.02 and a barrier height (Φb) of 1.11 eV for the Al/methyl red/p-InP contact were determined from the forward bias I-V characteristics. It was seen that the value of 1.11 eV obtained for Φb for the Al/methyl red/p-InP contact was significantly larger than the value of 0.83 eV for conventional Al/p-InP Schottky diodes. Modification of the interfacial potential barrier for the Al/p-InP diode was achieved using a thin interlayer of the methyl red organic semiconductor. This ascribed to the fact that the methyl red interlayer increases the effective Φb by influencing the space charge region of InP

Additional details

Identifiers

DOI
10.1088/0953-8984/20/04/045215;
PII
S0953-8984(08)64106-5;

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
20
Journal Issue
4
Journal Page Range
p. 045215
ISSN
0953-8984
CODEN
JCOMEL