Published January 2006
| Version v1
Journal article
Erbium-implanted silica microsphere laser
- 1. FOM Institute for Atomic and Molecular Physics, Kruislaan 407, 1098 SJ, Amsterdam (Netherlands)
- 2. Department of Applied Physics, California Institute of Technology, Pasadena, CA 91125 (United States)
- 3. Department of Material Science and Engineering, Stanford University, Stanford, CA 94305 (United States)
Description
Spherical silica optical microresonators were doped with erbium ions by ion implantation at energies of 925 keV and 2.05 MeV using a rotating stage. After thermal annealing at 800 deg. C, light was coupled into the microsphere using a tapered optical fiber. An optical quality factor as high as 1.9 x 107 was observed at λ = 1450 nm, corresponding to a modal loss of only 0.01 dB/cm. When pumped at 1450 nm, multi-mode lasing around 1570 nm is observed at a threshold between 150 and 250 μW depending on the overlap between mode and Er distribution. This work demonstrates the compatibility of ion implantation and microresonator technology
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.08.160;
- PII
- S0168-583X(05)01501-6;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 242
- Journal Issue
- 1-2
- Journal Page Range
- p. 182-185
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 14. international conference on ion beam modification of materials
- Dates
- 5-10 Sep 2004
- Place
- Pacific Grove, CA (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37068412
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; DISTRIBUTION; DOPED MATERIALS; ERBIUM; ERBIUM IONS; ION IMPLANTATION; KEV RANGE 100-1000; LASERS; MEV RANGE 01-10; OPTICAL FIBERS; QUALITY FACTOR; SILICA; SPHERICAL CONFIGURATION; TEMPERATURE RANGE 1000-4000 K
- Descriptors DEC
- CHARGED PARTICLES; CONFIGURATION; DIMENSIONLESS NUMBERS; ELEMENTS; ENERGY RANGE; FIBERS; HEAT TREATMENTS; IONS; KEV RANGE; MATERIALS; METALS; MEV RANGE; MINERALS; OXIDE MINERALS; RARE EARTHS; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.