Published January 2006 | Version v1
Journal article

Erbium-implanted silica microsphere laser

  • 1. FOM Institute for Atomic and Molecular Physics, Kruislaan 407, 1098 SJ, Amsterdam (Netherlands)
  • 2. Department of Applied Physics, California Institute of Technology, Pasadena, CA 91125 (United States)
  • 3. Department of Material Science and Engineering, Stanford University, Stanford, CA 94305 (United States)

Description

Spherical silica optical microresonators were doped with erbium ions by ion implantation at energies of 925 keV and 2.05 MeV using a rotating stage. After thermal annealing at 800 deg. C, light was coupled into the microsphere using a tapered optical fiber. An optical quality factor as high as 1.9 x 107 was observed at λ = 1450 nm, corresponding to a modal loss of only 0.01 dB/cm. When pumped at 1450 nm, multi-mode lasing around 1570 nm is observed at a threshold between 150 and 250 μW depending on the overlap between mode and Er distribution. This work demonstrates the compatibility of ion implantation and microresonator technology

Additional details

Identifiers

DOI
10.1016/j.nimb.2005.08.160;
PII
S0168-583X(05)01501-6;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
242
Journal Issue
1-2
Journal Page Range
p. 182-185
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
14. international conference on ion beam modification of materials
Dates
5-10 Sep 2004
Place
Pacific Grove, CA (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37068412
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANNEALING; DISTRIBUTION; DOPED MATERIALS; ERBIUM; ERBIUM IONS; ION IMPLANTATION; KEV RANGE 100-1000; LASERS; MEV RANGE 01-10; OPTICAL FIBERS; QUALITY FACTOR; SILICA; SPHERICAL CONFIGURATION; TEMPERATURE RANGE 1000-4000 K
Descriptors DEC
CHARGED PARTICLES; CONFIGURATION; DIMENSIONLESS NUMBERS; ELEMENTS; ENERGY RANGE; FIBERS; HEAT TREATMENTS; IONS; KEV RANGE; MATERIALS; METALS; MEV RANGE; MINERALS; OXIDE MINERALS; RARE EARTHS; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.