Thermal stability of iron silicide nanowires epitaxially grown on Si(110) substrates
- 1. School of Physical Science and Technology, ShanghaiTech University, 100 Haike Road, Pudong, Shanghai, 201210 (China)
- 2. Analytical and Testing Center, Shanghai Jiao Tong University, 800 Dongchuan Road, Shanghai 200240 (China)
Description
Highlights: • The α-FeSi2 nanowires epitaxially grown on Si(110) can be stable up to 750 °C. • The stable temperature of the nanowires is much lower than that of the bulk α-FeSi2 due to their small size and high relative surface area. • With increasing annealing temperature, the α-FeSi2 nanowires undergo an Ostwald ripening process and transform into large β-FeSi2 nanorods or three-dimensional nanocrystals. • The reduction in surface energy drives the transformation from metallic α-FeSi2 phase to semiconducting β-FeSi2 phase. - Abstract: Metallic α-FeSi2 nanowires (NWs) are epitaxially grown on Si(110) at 650 °C. Their evolution as a function of annealing temperature has been studied in situ by scanning tunneling microscopy. The NWs are stable up to 750 °C, which is much lower than that of the bulk α-FeSi2. With further increasing the annealing temperature, some NWs begin to shrink in length and transform into wider and higher semiconducting β-FeSi2 nanorods or three-dimensional (3D) islands at 925 °C. The phase transformation is driven by the reduction in surface energy. On the other hand, some α-FeSi2 NWs begin to dissolve and become thinner until disappearing. The growth of the β-FeSi2 nanorods or 3D nanocrystals follows the Ostwald ripening mechanism, i.e., the large islands grow in size at the expense of the small ones. X-ray photoelectron spectroscopy study shows that the Fe 2p peaks of β-FeSi2 nanocrystals exhibit a negative shift of 0.2 eV with respect to the α-FeSi2 NWs.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2016.12.056Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2016.12.056;
- PII
- S0169-4332(16)32773-8;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 399
- Journal Page Range
- p. 200-204
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48087502
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; EPITAXY; IRON SILICIDES; IRON-ALPHA; NANOWIRES; PHASE TRANSFORMATIONS; SCANNING TUNNELING MICROSCOPY; SILICON; STABILITY; SUBSTRATES; SURFACE AREA; SURFACE ENERGY; SURFACES; TEMPERATURE RANGE 0400-1000 K; THREE-DIMENSIONAL LATTICES; TUNNEL EFFECT; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CRYSTAL GROWTH METHODS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ELECTRON SPECTROSCOPY; ELEMENTS; ENERGY; FREE ENERGY; HEAT TREATMENTS; IRON; IRON COMPOUNDS; METALS; MICROSCOPY; NANOSTRUCTURES; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SEMIMETALS; SILICIDES; SILICON COMPOUNDS; SPECTROSCOPY; SURFACE PROPERTIES; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.