Published February 19, 1973
| Version v1
Report
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Semiconductor detector x-ray fluorescence analysis system
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.Files
4074533.pdf
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(545.4 kB)
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Additional details
Additional titles
- Original title (French)
- Systemes d'analyse par fluorescence X utilisant des detecteurs semiconducteurs
Publishing Information
- Imprint Pagination
- 37 p.
- Report number
- CEA-CONF--2251
Conference
- Title
- Half-day meeting on analysis using x-ray fluorescence and emission spectra.
- Dates
- 20 Dec 1972.
- Place
- Malakoff, France.
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 4074533
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COUNTING RATES; DATA PROCESSING; EFFICIENCY; ENERGY RESOLUTION; ENERGY SPECTRA; LI-DRIFTED SI DETECTORS; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROMETERS
- Descriptors DEC
- LITHIUM-DRIFTED DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SPECTRA; SPECTROMETERS
Optional Information
- Secondary number(s)
- CEA-SES-PUB-SAI--73-26.