Published February 1984
| Version v1
Journal article
Use of charged particle beams in materials analysis
Description
The general principles are given of methods using energetic particles for the analysis of materials;certain basic concepts and relations are defined. The current level of methodology is given for the following analytical procedures: PIXE, RBS and the nuclear reaction method; the area is defined of their most frequent applications. The possiblities of these methods are compared with other common analytical procedures
Additional details
Additional titles
- Original title (Czech)
- Pouziti svazku nabitych castic pro analyzu latek
Publishing Information
- Journal Title
- Cesk. Cas. Fys.
- Journal Volume
- 34
- Journal Issue
- 1
- Series
- Cesk. Cas. Fys.
- Journal Page Range
- 1-22
- ISSN
- 0009-0700
INIS
- Country of Publication
- Czech Republic
- Country of Input or Organization
- Serbia and Montenegro
- INIS RN
- 16020262
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- BACKSCATTERING; BIBLIOGRAPHIES; CHARGED PARTICLES; CONFIGURATION; CRYSTAL STRUCTURE; ION BEAMS; KEV RANGE 100-1000; LIQUIDS; MEV RANGE 01-10; NONDESTRUCTIVE ANALYSIS; NUCLEAR REACTION ANALYSIS; PARTICLE BEAMS; PIXE ANALYSIS; RADIATION SCATTERING ANALYSIS; RESOLUTION; REVIEWS; RUTHERFORD SCATTERING; SOLIDS
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; DOCUMENT TYPES; ELASTIC SCATTERING; ENERGY RANGE; FLUIDS; KEV RANGE; MEV RANGE; SCATTERING; X-RAY EMISSION ANALYSIS