High-resolution X-ray imaging and tomography at the ESRF beamline ID 22
Creators
- 1. European Synchrotron Radiation Facility (ESRF), B.P. 220, 38043 Grenoble (France)
- 2. Rheinisch-Westfaelische Technische Hochschule (RWTH), 52056 Aachen (Germany)
Description
At the ESRF micro-fluorescence, imaging and diffraction (μ-FID) beamline ID 22, a microimaging and tomography setup has been operational for several months. The coherence properties of the high-energy X-ray undulator beam at ID 22 make the setup especially suited for phase-contrast tomography including possible holographic reconstruction, but it is suited for absorption tomography too. A fast-readout, low-noise CCD camera makes time-resolved imaging possible. Recent developments in magnifying X-ray optics such as Compound Refractive Lenses (CRL) and Fresnel Zone Plates (FZP) open up the field of magnified-X-ray imaging with a resolution of less than 300 nm. Imaging techniques using a 'pink beam', i.e., a beam with limited monochromaticity obtained by filtering one harmonic from the undulator spectrum, can increase flux in intensity-limited experiments
Additional details
Identifiers
- DOI
- 10.1063/1.1291184;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 507
- Journal Issue
- 1
- Journal Page Range
- p. 424-429
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 6. international conference on X-ray microscopy
- Dates
- 2-6 Aug 1999
- Place
- Berkeley, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35069993
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CAMERAS; CHARGE-COUPLED DEVICES; COMPUTERIZED TOMOGRAPHY; ENERGY ABSORPTION; ENERGY RESOLUTION; EUROPEAN SYNCHROTRON RADIATION FACILITY; FRESNEL LENS; MICROSCOPY; MODULATION; REFRACTIVE INDEX; SYNCHROTRON RADIATION; X RADIATION; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ABSORPTION; BREMSSTRAHLUNG; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIAGNOSTIC TECHNIQUES; DIFFRACTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; LENSES; NONDESTRUCTIVE ANALYSIS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION SOURCES; RADIATIONS; RESOLUTION; SCATTERING; SEMICONDUCTOR DEVICES; SORPTION; SYNCHROTRON RADIATION SOURCES; TOMOGRAPHY; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- (c) 2000 American Institute of Physics.