X-ray quantitattive phase analysis of nitride layer during steel nitridation

A method of X-ray quantitative phase analysis of nitride layer during 40K kh, 20Kh, 18KhGT, 38KhMYuA, St45 steel nitridation is described. It is shown that it is necessary to choose diffraction msxima with identical effective e scattering layers tsub(eff.) as analytical lines for quantitative analysis of the zone of chemical compounds. Analysis tsub(eff.) for different lines of two iron nitrides has revealed that (200)sub(γ') and (101)sub(epsilon) or (111)sub(γ') and (101)sub(epsilon) lines are most suitable. Graphical dependen nce of relation of intensitios of lines of γ'- and epsilon-phases on compositio of the nitride layer is presented