ZrB2-SiC ceramics coating for Cf/SiC composites: Microstructure and anti-ablation mechanism
- 1. Science and Technology on Advanced Ceramic Fibers and Composites Laboratory, National University of Defense Technology, Changsha 410073 (China)
- 2. Equipment Academy of the Rocket Force, Beijing 100094 (China)
- 3. Research Institute of Chemical Defence, Beijing 100094 (China)
Description
Highlights: • ZrB2-SiC coatings were prepared by brushing process. • Anti-ablation mechanism of ZrB2-SiC coatings coated Cf/SiC composites was studied. • The linear and mass ablation rates were much lower than that of uncoated samples. • ZrB2-SiC coatings could improve the ablation resistance of Cf/SiC composites. In order to improve the oxidation behavior of Cf/SiC composites in oxygen atmosphere at high temperatures, ZrB2-SiC ceramics coatings were prepared on Cf/SiC composites by using a brushing process. The composition of the coating and the microstructure of the reaction products were investigated by XRD and SEM; the ratio of ZrB2: PCS was studied, and the anti-ablation test was used to analyze the stability of coating at higher temperature. The results showed that the coatings were homogenous by this method. The coatings could improve the stability effectively, when the ratio of ZrB2: PCS was 5:1, the coatings had the best interface combine intensity. Compare with the uncoated Cf/SiC samples, the coated Cf/SiC samples exhibited better anti-ablative property, the coating prevented the matrix from ablation efficiently.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2018.04.009Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2018.04.009;
- PII
- S0925838818312891;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 750
- Journal Page Range
- p. 857-862
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53080438
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; STABILITY; TEMPERATURE RANGE 0400-1000 K; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; EVALUATION; MICROSCOPY; SCATTERING; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2018 Published by Elsevier B.V.