Published June 2018 | Version v1
Journal article

ZrB2-SiC ceramics coating for Cf/SiC composites: Microstructure and anti-ablation mechanism

  • 1. Science and Technology on Advanced Ceramic Fibers and Composites Laboratory, National University of Defense Technology, Changsha 410073 (China)
  • 2. Equipment Academy of the Rocket Force, Beijing 100094 (China)
  • 3. Research Institute of Chemical Defence, Beijing 100094 (China)

Description

Highlights: • ZrB2-SiC coatings were prepared by brushing process. • Anti-ablation mechanism of ZrB2-SiC coatings coated Cf/SiC composites was studied. • The linear and mass ablation rates were much lower than that of uncoated samples. • ZrB2-SiC coatings could improve the ablation resistance of Cf/SiC composites. In order to improve the oxidation behavior of Cf/SiC composites in oxygen atmosphere at high temperatures, ZrB2-SiC ceramics coatings were prepared on Cf/SiC composites by using a brushing process. The composition of the coating and the microstructure of the reaction products were investigated by XRD and SEM; the ratio of ZrB2: PCS was studied, and the anti-ablation test was used to analyze the stability of coating at higher temperature. The results showed that the coatings were homogenous by this method. The coatings could improve the stability effectively, when the ratio of ZrB2: PCS was 5:1, the coatings had the best interface combine intensity. Compare with the uncoated Cf/SiC samples, the coated Cf/SiC samples exhibited better anti-ablative property, the coating prevented the matrix from ablation efficiently.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jallcom.2018.04.009

Additional details

Identifiers

DOI
10.1016/j.jallcom.2018.04.009;
PII
S0925838818312891;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
750
Journal Page Range
p. 857-862
ISSN
0925-8388
CODEN
JALCEU

INIS

Country of Publication
Switzerland
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
53080438
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
COMPARATIVE EVALUATIONS; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; STABILITY; TEMPERATURE RANGE 0400-1000 K; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; EVALUATION; MICROSCOPY; SCATTERING; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2018 Published by Elsevier B.V.