Published July 2, 2008 | Version v1
Journal article Metadata-only

Perovskites and thin films-crystallography and chemistry

Creators

  • 1. Department of Inorganic Chemistry, Stockholm University, S-106 91 Stockholm (Sweden)
  • 2. Institute for Physics of Condensed Matter, TU Braunschweig, D-38106 Braunschweig (Germany)

Description

We discuss the crystallographic and chemical basis of the perovskite family (ABX3) of oxides that are used in different thin film applications. Starting with the original structure we extend our scope to several modifications. Basic parameters like the ionic radii, the tolerance factor, the occupation of the oxygen sublattice and their effect on the structural parameters will be mentioned together with examples of relationships between structural and physical properties in the bulk and at interfaces

Availability note (English)

Available from http://dx.doi.org/10.1088/0953-8984/20/26/264001

Additional details

Identifiers

DOI
10.1088/0953-8984/20/26/264001;
PII
S0953-8984(08)65659-3;

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
20
Journal Issue
26
Journal Page Range
[6 p.]
ISSN
0953-8984
CODEN
JCOMEL

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40027203
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ATOMIC RADII; CHEMISTRY; CRYSTALLOGRAPHY; INTERFACES; MODIFICATIONS; OCCUPATIONS; OXIDES; OXYGEN; PEROVSKITE; PHYSICAL PROPERTIES; THIN FILMS; TOLERANCE
Descriptors DEC
CHALCOGENIDES; ELEMENTS; FILMS; MINERALS; NONMETALS; OXIDE MINERALS; OXYGEN COMPOUNDS; PEROVSKITES