Published October 2014 | Version v1
Journal article

Model-based approach for planning and evaluation of confocal measurements of rough surfaces

  • 1. Institut für Technische Optik, Stuttgart Research Center of Photonic Engineering (SCoPE), University of Stuttgart, Pfaffenwaldring 9, 70569 Stuttgart (Germany)

Description

Confocal sensors, along with white light interferometers, have been considered promising candidates for replacing traditional tactile sensors in the inspection of rough surfaces for several years now. However, despite their obvious advantages concerning measurement speed and a non-contact working principle, their acceptance for routine measurement tasks in industry is still unsatisfactory. This is presumably because the mechanisms that limit the resolution of such sensors are more complex than those of tactile sensors. The planning for the measurements, e.g. choosing the proper objective lens, is still a very challenging task. Therefore, many confocal measurements produce erroneous results because of improperly chosen sensor parameters. At the same time, the behavior of improperly configured sensors is not well understood, rendering the recognition of erroneous measurements a hard task as well. Current national as well as international technical standards suggest an approach based on the spatial frequencies of the surface profile and a cut-off frequency that is characteristic for the sensor. While this is in perfect analogy to optical two-dimensional imaging devices, we present theoretical as well as experimental reasoning against this approach. Instead, we propose an approach based on local surface curvatures and the radii of curvature of the illuminating wavefronts. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/25/10/105002

Additional details

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
25
Journal Issue
10
Journal Page Range
[7 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46068290
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
EQUIPMENT; EVALUATION; EXPERIMENT PLANNING; INSPECTION; INTERFEROMETERS; RESOLUTION; SENSORS; SURFACES
Descriptors DEC
MEASURING INSTRUMENTS; PLANNING