Published November 1, 2010 | Version v1
Journal article

Dewetting behavior of Au films on porous substrates

  • 1. Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk, 790784 (Korea, Republic of)
  • 2. School of Physical Electronics, University of Electronic Science and Technology of China (UESTC), Chengdu, Sichuan, 610054 (China)

Description

Understanding the stability of thin films and their spontaneous pattern formation upon dewetting is essential to a host of physical phenomena. In this paper, we study the dewetting phenomena of Au thin films deposited on anodic aluminum oxide (AAO) membranes to analyze the stability of the metal film on porous substrates. AAO membranes, as-sputtered and dewetted Au films are all characterized by scanning electronic microscopy and X-ray diffraction. We found that both the roughness of AAO surface and modification of AAO pores exhibit remarkable influences on the dewetting behavior of Au films. The observed dewetting phenomena are explained from an energetic point of view since dewetting is a process of minimization of the system free energy.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2010.08.128

Additional details

Identifiers

DOI
10.1016/j.tsf.2010.08.128;
PII
S0040-6090(10)01246-0;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
519
Journal Issue
2
Journal Page Range
p. 706-713
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
Romanian conference on advanced materials 2009
Acronym
ROCAM 2009
Dates
25-28 Aug 2009
Place
Brashov (Romania)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42067266
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AGGLOMERATION; ALUMINIUM OXIDES; ANNEALING; FREE ENERGY; MINIMIZATION; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; SURFACES; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ENERGY; FILMS; HEAT TREATMENTS; MATERIALS; MICROSCOPY; OPTIMIZATION; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; THERMODYNAMIC PROPERTIES

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.