Exchange coupling effects in CoCrPt-SiO2/FeCoTaCr composite media for perpendicular recording
- 1. Department of Materials Science and Engineering, National University of Singapore, Singapore 119260 (Singapore)
- 2. Data Storage Institute, Singapore 117608 (Singapore)
Description
The exchange coupled composite (ECC) media consisting of a magnetically hard CoCrPt-SiO2 layer and a magnetically soft FeCoTaCr layer were fabricated as an approach to improve writability. A nonmagnetic CoCr layer with different thickness was inserted between the hard and soft layers to adjust the exchange coupling strength. With proper CoCr thickness, a decrease of coercivity was observed. Transmission electron microscopy (TEM) revealed that the soft/hard stacked grains were magnetically isolated by SiO2 along grain boundaries. Magnetic properties were characterized by vibrating sample magnetometer (VSM). Angle-dependent coercivity indicated that the stacked magnetic grains switched magnetically in a coherent mode. Angle-dependent switching field demonstrated that ECC media had a better tolerance of the angle dispersion than perpendicular media. The switching field decreased with the increase in thickness of the soft magnetic layer. However, the thermal stability factor was kept almost constant (150) until the soft layer was over 3.3 nm
Additional details
Identifiers
- DOI
- 10.1088/0031-8949/2007/T129/032;
- PII
- S0031-8949(07)60111-32;
Publishing Information
- Journal Title
- Physica Scripta (Online)
- Journal Volume
- 2007
- Journal Issue
- T129
- Journal Page Range
- p. 140-143
- ISSN
- 1402-4896
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39028753
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHROMIUM COMPOUNDS; COBALT COMPOUNDS; COERCIVE FORCE; COMPOSITE MATERIALS; GRAIN BOUNDARIES; IRON COMPOUNDS; LAYERS; MAGNETIC PROPERTIES; PLATINUM COMPOUNDS; SILICON OXIDES; TANTALUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; VIBRATING SAMPLE MAGNETOMETERS
- Descriptors DEC
- CHALCOGENIDES; ELECTRON MICROSCOPY; MAGNETOMETERS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS